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| Keyword : ATPG
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A Test Pattern Compaction Method Using SAT-Based Fault Grouping
Yusuke MATSUNAGA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A
No. 12 ;
pp. 2302-2309
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
ATPG, SAT, test pattern, | | | Summary | Full Text:PDF | |
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Multi-Cycle Path Detection for Sequential Circuits and Its Application to Real Designs
Hiroyuki HIGUCHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A
No. 12 ;
pp. 3176-3183
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic and High Level Synthesis
Keyword:
multi-cycle path, false path, sequential circuit, implication, ATPG, multiple clock, | | | Summary | Full Text:PDF | |
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High-Level Test Generation for Asynchronous Circuits from Signal Transition Graph
Eunjung OH Soo-Hyun KIM Dong-Ik LEE Ho-Yong CHOI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2002/12/01
Vol. E85-A
No. 12 ;
pp. 2674-2683
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Generation
Keyword:
asynchronous circuits, ATPG, STG, | | | Summary | Full Text:PDF | |
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Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification
Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A
No. 6 ;
pp. 1506-1514
Type of Manuscript:
Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
Category:
Keyword:
ATPG, SI asynchronous circuits, signal transition graph, testing, | | | Summary | Full Text:PDF | |
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