Keyword : SI asynchronous circuits

Test Generation for SI Asynchronous Circuits with Undetectable Faults from Signal Transition Graph Specification
Eunjung OH Jeong-Gun LEE Dong-Ik LEE Ho-Yong CHOI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/06/01
Vol. E84-A  No. 6 ; pp. 1506-1514
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2000 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2000))
ATPGSI asynchronous circuitssignal transition graphtesting
 Summary | Full Text:PDF