Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D
No. 10 ;
pp. 1483-1489
Type of Manuscript:
Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test Generation and Modification
Keyword:
test power reduction, scan testing, ATPG, test modification, |
