Keyword : low power test

Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures
Tian CHEN Dandan SHEN Xin YI Huaguo LIANG Xiaoqing WEN Wei WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/11/01
Vol. E99-D  No. 11 ; pp. 2672-2681
Type of Manuscript:  PAPER
Category: Computer System
Keyword: 
low power test, data compression, LFSR, X-filling, 
 Summary | Full Text:PDF
A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testing, ATPG, IR-drop, test power reduction, low power test, 
 Summary | Full Text:PDF
A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption
Yongjoon KIM Jaeseok PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/01/01
Vol. E93-D  No. 1 ; pp. 193-196
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT), scan testing, scan cell reordering, low power test, 
 Summary | Full Text:PDF
MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs
Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/04/01
Vol. E91-D  No. 4 ; pp. 1197-1200
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
low power test, scan-based test, X-filling, test application time, 
 Summary | Full Text:PDF