Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3
pp. 726-735
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword:
test data compression, test response compaction, BIST-aided scan test, X-value, ATPG, |
