Masao ASO

A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9  pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testing, ATPG, IR-drop, test power reduction, low power test, 
 Summary | Full Text:PDF
A Unified Process and Device Simulation System--P & D Workbench--
Yukio TAMEGAYA Hideki IKEUCHI Hiroyoshi KUGE Yutaka AKIYAMA Yuukichi HATANAKA Masao ASOU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2  pp. 234-240
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
unified simulator, integrated simulator, supervised simulator, process and device simulator, 
 Summary | Full Text:PDF