Keyword : test pattern


A Test Pattern Compaction Method Using SAT-Based Fault Grouping
Yusuke MATSUNAGA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12 ; pp. 2302-2309
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
ATPGSATtest pattern
 Summary | Full Text:PDF

Selection of Test Patterns in an Iterative Erasure and Error Decoding Algorithm for Non-binary Block Codes
Hitoshi TOKUSHIGE Ippei HISADOMI Tadao KASAMI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2006/11/01
Vol. E89-A  No. 11 ; pp. 3355-3359
Type of Manuscript:  LETTER
Category: Coding Theory
Keyword: 
iterative decodingerasure and error decodingtest patternnon-binary code
 Summary | Full Text:PDF