Takashi AIKYO

Generation of Diagnostic Tests for Transition Faults Using a Stuck-At ATPG Tool
Yoshinobu HIGAMI Satoshi OHNO Hironori YAMAOKA Hiroshi TAKAHASHI Yoshihiro SHIMIZU Takashi AIKYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/04/01
Vol. E95-D  No. 4  pp. 1093-1100
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
fault diagnosis, test generation, transition faults, stuck-at ATPG, 
 Summary | Full Text:PDF
Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing
Kohei MIYASE Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Yuta YAMATO Hiroshi FURUKAWA Xiaoqing WEN Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/06/01
Vol. E94-D  No. 6  pp. 1216-1226
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
ATPG, X-bit, X-identification, X-filling, 
 Summary | Full Text:PDF
A Study of Capture-Safe Test Generation Flow for At-Speed Testing
Kohei MIYASE Xiaoqing WEN Seiji KAJIHARA Yuta YAMATO Atsushi TAKASHIMA Hiroshi FURUKAWA Kenji NODA Hideaki ITO Kazumi HATAYAMA Takashi AIKYO Kewal K. SALUJA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/07/01
Vol. E93-A  No. 7  pp. 1309-1318
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
at-speed scan testing, test generation, X-bit identification, X-filling, capture-safety checking, 
 Summary | Full Text:PDF
Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 675-682
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
diagnosis, fault model, fault location, fault simulation, combinational circuits, pass/fail information, 
 Summary | Full Text:PDF
Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate
Masayuki ARAI Satoshi FUKUMOTO Kazuhiko IWASAKI Tatsuru MATSUO Takahisa HIRAIDE Hideaki KONISHI Michiaki EMORI Takashi AIKYO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 726-735
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Test Compression
Keyword: 
test data compression, test response compaction, BIST-aided scan test, X-value, ATPG, 
 Summary | Full Text:PDF
Post-BIST Fault Diagnosis for Multiple Faults
Hiroshi TAKAHASHI Yoshinobu HIGAMI Shuhei KADOYAMA Yuzo TAKAMATSU Koji YAMAZAKI Takashi AIKYO Yasuo SATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3  pp. 771-775
Type of Manuscript:  Special Section LETTER (Special Section on Test and Verification of VLSIs)
Category: 
Keyword: 
post-BIST fault diagnosis, multiple stuck-at faults, combinational circuits, pass/fail information, 
 Summary | Full Text:PDF