Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12 ;
pp. 2320-2327 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: IR-drop, power-supply-noise, timing analysis, testing,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-ANo. 12 ;
pp. 2310-2319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: at-speed scan testing, IR-drop, capture-power-safety, logic path, clock path, clock stretch, test quality,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-DNo. 9 ;
pp. 2003-2011 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: at-speed testing, ATPG, IR-drop, test power reduction, low power test,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/09/01 Vol. E93-ANo. 9 ;
pp. 1585-1593 Type of Manuscript: PAPER Category: VLSI Design Technology and CAD Keyword: IR-drop, power-grid, power-ring, decoupling capacitance, response surface method,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-DNo. 9 ;
pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-DNo. 5 ;
pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,