IEICE Trans

Keyword : scan testing

Selective Scan Slice Grouping Technique for Efficient Test Data Compression Yongjoon KIM Jaeseok PARK Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/02/01 Vol. E93-D No. 2 ; pp. 380-383 Type of Manuscript: LETTER Category: Dependable Computing Keyword: design for testability (DfT), scan testing, SoC test, test data compression,
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A Selective Scan Chain Activation Technique for Minimizing Average and Peak Power Consumption Yongjoon KIM Jaeseok PARK Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2010/01/01 Vol. E93-D No. 1 ; pp. 193-196 Type of Manuscript: LETTER Category: Dependable Computing Keyword: design for testability (DfT), scan testing, scan cell reordering, low power test,
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Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/07/01 Vol. E92-D No. 7 ; pp. 1462-1465 Type of Manuscript: LETTER Category: VLSI Systems Keyword: design for testability (DfT), scan testing, test data compression,
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Test Compression for Robust Testable Path Delay Fault Testing Using Interleaving and Statistical Coding Kazuteru NAMBA Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/02/01 Vol. E92-D No. 2 ; pp. 269-282 Type of Manuscript: PAPER Category: Dependable Computing Keyword: test compression, statistical coding, run-length coding, delay fault testing, two-pattern testing, scan testing,
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A Novel ATPG Method for Capture Power Reduction during Scan Testing Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-D No. 9 ; pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
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A New Method for Low-Capture-Power Test Generation for Scan Testing Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-D No. 5 ; pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
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Average Power Reduction in Scan Testing by Test Vector Modification Seiji KAJIHARA Koji ISHIDA Kohei MIYASE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-D No. 10 ; pp. 1483-1489 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Test Generation and Modification Keyword: test power reduction, scan testing, ATPG, test modification,
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