Keyword : IR-drop


Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration
Cheng-Yu HAN Yu-Ching LI Hao-Tien KAN James Chien-Mo LI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12 ; pp. 2320-2327
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
IR-droppower-supply-noisetiming analysistesting
 Summary | Full Text:PDF

Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation
Fuqiang LI Xiaoqing WEN Kohei MIYASE Stefan HOLST Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A  No. 12 ; pp. 2310-2319
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: 
Keyword: 
at-speed scan testingIR-dropcapture-power-safetylogic pathclock pathclock stretchtest quality
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On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST
Akihiro TOMITA Xiaoqing WEN Yasuo SATO Seiji KAJIHARA Kohei MIYASE Stefan HOLST Patrick GIRARD Mohammad TEHRANIPOOR Laung-Terng WANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/10/01
Vol. E97-D  No. 10 ; pp. 2706-2718
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
at-speed scan-based logic BISTcapture power safetymaskingIR-droptransition delay faultlong sensitized path
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A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing
Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 2003-2011
Type of Manuscript:  Special Section PAPER (Special Section on Dependable Computing)
Category: 
Keyword: 
at-speed testingATPGIR-droptest power reductionlow power test
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A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
Yuta YAMATO Xiaoqing WEN Kohei MIYASE Hiroshi FURUKAWA Seiji KAJIHARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2011/04/01
Vol. E94-D  No. 4 ; pp. 833-840
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
X-fillinggenetic algorithmlaunch switching activityIR-dropat-speed scan testing
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Simple Analytical Formulas for Estimating IR-Drops in an Early Design Stage
Kazuyuki OOYA Yuji TAKASHIMA Atsushi KUROKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/09/01
Vol. E93-A  No. 9 ; pp. 1585-1593
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
IR-droppower-gridpower-ringdecoupling capacitanceresponse surface method
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A Novel ATPG Method for Capture Power Reduction during Scan Testing
Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/09/01
Vol. E90-D  No. 9 ; pp. 1398-1405
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF

A New Method for Low-Capture-Power Test Generation for Scan Testing
Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/05/01
Vol. E89-D  No. 5 ; pp. 1679-1686
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
scan testingcapture powerX-bitIR-drop
 Summary | Full Text:PDF