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Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns James Chien-Mo LI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/04/01
Vol. E88-A
No. 4
pp. 1024-1030
Type of Manuscript:
PAPER Category: VLSI Design Technology and CAD Keyword: diagnosis, design for testability, delay fault testing, | | Summary | Full Text:PDF | |
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