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Keyword :
X
-filling
A GA-Based
X
-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
Yuta YAMATO
Xiaoqing WEN
Kohei MIYASE
Hiroshi FURUKAWA
Seiji KAJIHARA
Publication:
IEICE TRANSACTIONS on Information and Systems
Publication Date:
2011/04/01
Vol.
E94-D
No.
4
;
pp.
833-840
Type of Manuscript:
PAPER
Category:
Dependable Computing
Keyword:
X
-filling
,
genetic algorithm
,
launch switching activity
,
IR-drop
,
at-speed scan testing
,
Summary
|
Full Text:PDF
A Study of Capture-Safe Test Generation Flow for At-Speed Testing
Kohei MIYASE
Xiaoqing WEN
Seiji KAJIHARA
Yuta YAMATO
Atsushi TAKASHIMA
Hiroshi FURUKAWA
Kenji NODA
Hideaki ITO
Kazumi HATAYAMA
Takashi AIKYO
Kewal K. SALUJA
Publication:
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date:
2010/07/01
Vol.
E93-A
No.
7
;
pp.
1309-1318
Type of Manuscript:
PAPER
Category:
VLSI Design Technology and CAD
Keyword:
at-speed scan testing
,
test generation
,
X
-bit identification
,
X
-filling
,
capture-safety checking
,
Summary
|
Full Text:PDF