IEICE Trans

Keyword : IR-drop

Power-Supply-Noise-Aware Timing Analysis and Test Pattern Regeneration Cheng-Yu HAN Yu-Ching LI Hao-Tien KAN James Chien-Mo LI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-A No. 12 ; pp. 2320-2327 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: IR-drop, power-supply-noise, timing analysis, testing,
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Logic-Path-and-Clock-Path-Aware At-Speed Scan Test Generation Fuqiang LI Xiaoqing WEN Kohei MIYASE Stefan HOLST Seiji KAJIHARA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/12/01 Vol. E99-A No. 12 ; pp. 2310-2319 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: at-speed scan testing, IR-drop, capture-power-safety, logic path, clock path, clock stretch, test quality,
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On Achieving Capture Power Safety in At-Speed Scan-Based Logic BIST Akihiro TOMITA Xiaoqing WEN Yasuo SATO Seiji KAJIHARA Kohei MIYASE Stefan HOLST Patrick GIRARD Mohammad TEHRANIPOOR Laung-Terng WANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2014/10/01 Vol. E97-D No. 10 ; pp. 2706-2718 Type of Manuscript: PAPER Category: Dependable Computing Keyword: at-speed scan-based logic BIST, capture power safety, masking, IR-drop, transition delay fault, long sensitized path,
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A Capture-Safety Checking Metric Based on Transition-Time-Relation for At-Speed Scan Testing Kohei MIYASE Ryota SAKAI Xiaoqing WEN Masao ASO Hiroshi FURUKAWA Yuta YAMATO Seiji KAJIHARA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-D No. 9 ; pp. 2003-2011 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: at-speed testing, ATPG, IR-drop, test power reduction, low power test,
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A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing Yuta YAMATO Xiaoqing WEN Kohei MIYASE Hiroshi FURUKAWA Seiji KAJIHARA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2011/04/01 Vol. E94-D No. 4 ; pp. 833-840 Type of Manuscript: PAPER Category: Dependable Computing Keyword: X-filling, genetic algorithm, launch switching activity, IR-drop, at-speed scan testing,
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Simple Analytical Formulas for Estimating IR-Drops in an Early Design Stage Kazuyuki OOYA Yuji TAKASHIMA Atsushi KUROKAWA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/09/01 Vol. E93-A No. 9 ; pp. 1585-1593 Type of Manuscript: PAPER Category: VLSI Design Technology and CAD Keyword: IR-drop, power-grid, power-ring, decoupling capacitance, response surface method,
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A Novel ATPG Method for Capture Power Reduction during Scan Testing Xiaoqing WEN Seiji KAJIHARA Kohei MIYASE Tatsuya SUZUKI Kewal K. SALUJA Laung-Terng WANG Kozo KINOSHITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-D No. 9 ; pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
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A New Method for Low-Capture-Power Test Generation for Scan Testing Xiaoqing WEN Yoshiyuki YAMASHITA Seiji KAJIHARA Laung-Terng WANG Kewal K. SALUJA Kozo KINOSHITA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-D No. 5 ; pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
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