|
| Keyword : BIST
| |
| |
| |
| |
| |
| |
|
A Method of Locating Open Faults on Incompletely Identified Pass/Fail Information
Koji YAMAZAKI Yuzo TAKAMATSU | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3 ;
pp. 661-666
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword:
fault diagnosis, open fault, BIST, pass/fail information, | | | Summary | Full Text:PDF | |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
| |
|
BIST Circuit Macro Using Microprogram ROM for LSI Memories
Hiroki KOIKE Toshio TAKESHIMA Masahide TAKADA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C
No. 7 ;
pp. 838-844
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category:
Keyword:
memory, BIST, ROM, tester, macro, | | | Summary | Full Text:PDF | |
| |
|
|