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BIST Circuit Macro Using Microprogram ROM for LSI Memories Hiroki KOIKE Toshio TAKESHIMA Masahide TAKADA | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C
No. 7 ;
pp. 838-844
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category: Keyword: memory, BIST, ROM, tester, macro, | | Summary | Full Text:PDF | |
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