Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A
No. 11 ;
pp. 2731-2738
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test Keyword: test time, BIST, external test, CBET, test scheduling, test access, test bus, external pins, |