Keyword : PRBS


Channel-Count-Independent BIST for Multi-Channel SerDes
Kouichi YAMAGUCHI Muneo FUKAISHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2006/03/01
Vol. E89-C  No. 3 ; pp. 314-319
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design Technology in the Sub-100 nm Era)
Category: Interface and Interconnect Techniques
Keyword: 
SerDesBISTat-speed testingPRBSmulti-channel synchronization
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