A Test Methodology for Core-Based System LSIs

Makoto SUGIHARA  Hiroshi DATE  Hiroto YASUURA  

IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences   Vol.E81-A   No.12   pp.2640-2645
Publication Date: 1998/12/25
Online ISSN: 
Print ISSN: 0916-8508
Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
testing time,  core-based system LSI,  BIST,  external testing,  

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In this paper, we propose a test methodology for core-based system LSIs. Our test methodology aims to decrease testing time for core-based system LSIs. In our method, every core is supplied with several sets of test vectors. Every set of test vectors guarantees sufficient fault coverage. Each set of test vectors consists of two parts. One is based on built-in self-test (BIST) and the other is based on external testing. These sets of test vectors are designed to have different ratio of BIST to external testing each other for every core. We can minimize testing time for core-based system LSIs by selecting from the given sets of test vectors for each core. The main contributions of this paper are summarized as follows. (i) BIST is efficiently combined with external testing to relax the limitation of the external primary inputs and outputs. (ii) External testing for one of cores and BISTs for the others are performed in parallel to reduce the total testing time. (iii) The testing time minimization problem for core-based system LSIs is formulated as a combinatorial optimization problem to select the optimal set of test vectors from given sets of test vectors for each core.