Keyword : external test


Optimization of Test Accesses with a Combined BIST and External Test Scheme
Makoto SUGIHARA Hiroto YASUURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A  No. 11 ; pp. 2731-2738
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test timeBISTexternal testCBETtest schedulingtest accesstest busexternal pins
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