Keyword : seed generation


Deterministic Built-in Test with Neighborhood Pattern Generator
Michinobu NAKAO Yoshikazu KIYOSHIGE Koichiro NATSUME Kazumi HATAYAMA Satoshi FUKUMOTO Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/05/01
Vol. E85-D  No. 5 ; pp. 874-883
Type of Manuscript:  PAPER
Category: Fault Tolerance
Keyword: 
BISTtest pattern generatorreseedingbit-flippingseed generation
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