Keyword : test points


On Acceleration of Test Points Selection for Scan-Based BIST
Michinobu NAKAO Kazumi HATAYAMA Isao HIGASHI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 668-674
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Built-in Self-Test
Keyword: 
test pointsBISToptimizationtestability
 Summary | Full Text:PDF