Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2009/07/01 Vol. E92-DNo. 7 ;
pp. 1462-1465 Type of Manuscript: LETTER Category: VLSI Systems Keyword: design for testability (DfT), scan testing, test data compression,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/09/01 Vol. E90-DNo. 9 ;
pp. 1398-1405 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/05/01 Vol. E89-DNo. 5 ;
pp. 1679-1686 Type of Manuscript: PAPER Category: Dependable Computing Keyword: scan testing, capture power, X-bit, IR-drop,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-DNo. 10 ;
pp. 1483-1489 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Test Generation and Modification Keyword: test power reduction, scan testing, ATPG, test modification,