Eunsei PARK


Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time
Yongjoon KIM Myung-Hoon YANG Jaeseok PARK Eunsei PARK Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/07/01
Vol. E92-D  No. 7  pp. 1462-1465
Type of Manuscript:  LETTER
Category: VLSI Systems
Keyword: 
design for testability (DfT)scan testingtest data compression
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