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Selective Scan Slice Grouping Technique for Efficient Test Data Compression
Yongjoon KIM Jaeseok PARK Sungho KANG
IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/02/01
Online ISSN: 1745-1361
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
design for testability (DfT), scan testing, SoC test, test data compression,
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This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.