IEICE Trans - Selective Scan Slice Grouping Technique for Efficient Test Data Compression

Selective Scan Slice Grouping Technique for Efficient Test Data Compression

Yongjoon KIM  Jaeseok PARK  Sungho KANG

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E93-D   No.2   pp.380-383
Publication Date: 2010/02/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E93.D.380
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword:
design for testability (DfT),  scan testing,  SoC test,  test data compression,

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Summary:
This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.