Selective Scan Slice Grouping Technique for Efficient Test Data Compression

Yongjoon KIM  Jaeseok PARK  Sungho KANG  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E93-D   No.2   pp.380-383
Publication Date: 2010/02/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E93.D.380
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: Dependable Computing
Keyword: 
design for testability (DfT),  scan testing,  SoC test,  test data compression,  

Full Text: PDF>>
Buy this Article




Summary: 
This paper presents a selective scan slice grouping technique for test data compression. In conventional selective encoding methods, the existence of a conflict bit contributes to large encoding data. However, many conflict bits are efficiently removed using the scan slice grouping technique, which leads to a dramatic improvement of encoding efficiency. Experiments performed with large ITC'99 benchmark circuits presents the effectiveness of the proposed technique and the test data volume is reduced up to 92% compared to random-filled test patterns.