Grouped Scan Slice Repetition Method for Reducing Test Data Volume and Test Application Time

Yongjoon KIM  Myung-Hoon YANG  Jaeseok PARK  Eunsei PARK  Sungho KANG  

Publication
IEICE TRANSACTIONS on Information and Systems   Vol.E92-D   No.7   pp.1462-1465
Publication Date: 2009/07/01
Online ISSN: 1745-1361
DOI: 10.1587/transinf.E92.D.1462
Print ISSN: 0916-8532
Type of Manuscript: LETTER
Category: VLSI Systems
Keyword: 
design for testability (DfT),  scan testing,  test data compression,  

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Summary: 
This paper presents a grouped scan slice encoding technique using scan slice repetition to simultaneously reduce test data volume and test application time. Using this method, many scan slices that would be incompatible with the conventional selective scan slice method can be encoded as compatible scan slices. Experiments were performed with ISCAS'89 and ITC'99 benchmark circuits, and results show the effectiveness of the proposed method.