|
| Keyword : test data compression
| |
| |
| |
| |
| |
|
X-Handling for Current X-Tolerant Compactors with More Unknowns and Maximal Compaction
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A
No. 12 ;
pp. 3119-3127
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verfication
Keyword:
scan test, test data compression, X-masking, | | | Summary | Full Text:PDF | |
| |
|
A Unified Test Compression Technique for Scan Stimulus and Unknown Masking Data with No Test Loss
Youhua SHI Nozomu TOGAWA Masao YANAGISAWA Tatsuo OHTSUKI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/12/01
Vol. E91-A
No. 12 ;
pp. 3514-3523
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Logic Synthesis, Test and Verification
Keyword:
scan test, test data compression, X-masking, | | | Summary | Full Text:PDF | |
| |
| |
| |
| |
| |
| |
| |
|
|