A Novel Dictionary-Based Method for Test Data Compression Using Heuristic Algorithm

Diancheng WU  Jiarui LI  Leiou WANG  Donghui WANG  Chengpeng HAO  

IEICE TRANSACTIONS on Electronics   Vol.E99-C    No.6    pp.730-733
Publication Date: 2016/06/01
Online ISSN: 1745-1353
DOI: 10.1587/transele.E99.C.730
Type of Manuscript: BRIEF PAPER
Category: Semiconductor Materials and Devices
automatic test equipment,  test data compression,  heuristic algorithm,  maximum clique problem,  dictionary-based compression,  

Full Text: PDF>>
Buy this Article

This paper presents a novel data compression method for testing integrated circuits within the selective dictionary coding framework. Due to the inverse value of dictionary indices made use of for the compatibility analysis with the heuristic algorithm utilized to solve the maximum clique problem, the method can obtain a higher compression ratio than existing ones.