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Design and Investigation of Silicon Gate-All-Around Junctionless Field-Effect Transistor Using a Step Thickness Gate Oxide
Wenlun ZHANG Baokang WANG | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2021/08/01
Vol. E104-C
No. 8 ;
pp. 379-385
Type of Manuscript:
PAPER
Category: Semiconductor Materials and Devices
Keyword:
JLFET, TCAD, GIDL, BTBT, GAA transistor, | | | Summary | Full Text:PDF | |
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A Novel CDM-Like Discharge Effect during Human Body Model (HBM) ESD Stress
Valery AXELRAD Yoon HUH Jau-Wen CHEN Peter BENDIX | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2003/03/01
Vol. E86-C
No. 3 ;
pp. 398-403
Type of Manuscript:
INVITED PAPER (Special Issue on the 2002 IEEE International Conference on Simulation of Semiconductor Processes and Devices (SISPAD'02))
Category:
Keyword:
HBM, ESD protection, TCAD, mixed-mode circuit, | | | Summary | Full Text:PDF | |
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TCAD--Yesterday, Today and Tomorrow
Robert W. DUTTON | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1999/06/25
Vol. E82-C
No. 6 ;
pp. 791-799
Type of Manuscript:
INVITED PAPER (Special Issue on TCAD for Semiconductor Industries)
Category:
Keyword:
TCAD, device simulation, process simulation, IC technology, diffusion, ion implantation, oxidation, MOS scaling, modeling, hierarchy, atomic-scale phenomena, | | | Summary | Full Text:PDF | |
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