Keyword : recessed-oxide MOSFETs


Three-Dimensional Evaluation of Substrate Current in Recessed-Oxide MOSFETs
Anna PIERANTONI Paolo CIAMPOLINI Antonio GNUDI Giorgio BACCARANI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 181-188
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
TCADdevice simulationhot-electron effectsrecessed-oxide MOSFETs
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