Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/02/25 Vol. E77-CNo. 2pp. 214-219 Type of Manuscript: Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93)) Category: Numerics Keyword: device simulation, mesh generation, error indicators,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/02/25 Vol. E75-CNo. 2pp. 181-188 Type of Manuscript: Special Section PAPER (Special Issue on Selected Papers from '91 VPAD) Category: Keyword: TCAD, device simulation, hot-electron effects, recessed-oxide MOSFETs,