Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2000/10/25 Vol. E83-CNo. 10 ;
pp. 1594-1601 Type of Manuscript: Special Section PAPER (Special Issue on Electronic Displays) Category: Keyword: cathode ray tube, moire pattern, electron beam, shadow mask, image simulation,
An Evaluation Method for CRT Moire Patterns by Visibility Estimation and Image Simulation Naoki SHIRAMATSUShuji IWATA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1997/08/25 Vol. E80-CNo. 8 ;
pp. 1095-1100 Type of Manuscript: Special Section PAPER (Special Issue on Advanced Emissive Displays) Category: Keyword: cathode ray tube, moire pattern, electron beam, shadow mask, image simulation,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/25 Vol. E77-CNo. 3 ;
pp. 445-452 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Process Technology Keyword: cell projection, electron beam, lithography, mask process, exposure data,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/02/25 Vol. E77-CNo. 2 ;
pp. 98-105 Type of Manuscript: Special Section PAPER (Special Issue on 1993 VLSI Process and Device Modeling Workshop (VPAD 93)) Category: Process Simulation Keyword: lithography simulation, pattern fluctuation PMMA, SAL-601, electron beam,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/01/25 Vol. E76-CNo. 1 ;
pp. 124-135 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: asic, pipeline, adaptive, electron beam,