Keyword : image simulation


Visibility Evaluation of the Inverse-Phase CRT Raster Moire Pattern
Naoki SHIRAMATSU Shuji IWATA Takumi MINEMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2000/10/25
Vol. E83-C  No. 10 ; pp. 1594-1601
Type of Manuscript:  Special Section PAPER (Special Issue on Electronic Displays)
Category: 
Keyword: 
cathode ray tubemoire patternelectron beamshadow maskimage simulation
 Summary | Full Text:PDF

An Evaluation Method for CRT Moire Patterns by Visibility Estimation and Image Simulation
Naoki SHIRAMATSU Shuji IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/08/25
Vol. E80-C  No. 8 ; pp. 1095-1100
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Emissive Displays)
Category: 
Keyword: 
cathode ray tubemoire patternelectron beamshadow maskimage simulation
 Summary | Full Text:PDF