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| Keyword : critical path
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PCHECK: A Delay Analysis Tool for High Performance LSI Design
Yoshio MIKI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1996/12/25
Vol. E79-A
No. 12 ;
pp. 2117-2122
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
delay analysis, critical path, device delay, wire delay, PCHECK, | | | Summary | Full Text:PDF | |
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