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On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques
Chia-Yi LIN Li-Chung HSU Hung-Ming CHEN | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C
No. 3
pp. 369-378
Type of Manuscript:
Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
Category:
Keyword:
DFT, TSP, test power, | | | Summary | Full Text:PDF | |
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An Efficient Pipeline Architecture for Deblocking Filter in H.264/AVC
Chung-Ming CHEN Chung-Ho CHEN | Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/01/01
Vol. E90-D
No. 1
pp. 99-107
Type of Manuscript:
Special Section PAPER (Special Section on Advanced Image Technology)
Category:
Keyword:
deblocking filter, H.264/AVC, video coding, | | | Summary | Full Text:PDF | |
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Noise Parameters Computation of Microwave Devices Using Genetic Algorithms
Han-Yu CHEN Guo-Wei HUANG Kun-Ming CHEN Chun-Yen CHANG | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2005/07/01
Vol. E88-C
No. 7
pp. 1382-1384
Type of Manuscript:
Special Section LETTER (Special Section on Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Applications)
Category: Active Circuits & Antenna
Keyword:
noisy two-port, noise parameters, genetic algorithm, | | | Summary | Full Text:PDF | |
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A Successive Times Based Scheduling for VoIP Services over HFC Networks
Bih-Hwang LEE Jhih-Ming CHEN | Publication: IEICE TRANSACTIONS on Communications
Publication Date: 2004/11/01
Vol. E87-B
No. 11
pp. 3343-3351
Type of Manuscript:
PAPER
Category: Multimedia Systems for Communications" Multimedia Systems for Communications
Keyword:
VoIP, HFC, DOCSIS, UGS/AD, CMTS, scheduling algorithm, | | | Summary | Full Text:PDF | |
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An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN Guo-Wei HUANG Kun-Ming CHEN | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C
No. 5
pp. 742-748
Type of Manuscript:
Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword:
on-wafer, noise figure measurement, low-noise amplifier, | | | Summary | Full Text:PDF | |
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