Keyword : TSP

On Reducing Test Power, Volume and Routing Cost by Chain Reordering and Test Compression Techniques
Chia-Yi LIN Li-Chung HSU Hung-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/03/01
Vol. E93-C  No. 3 ; pp. 369-378
Type of Manuscript:  Special Section PAPER (Special Section on Circuits and Design Techniques for Advanced Large Scale Integration)
DFTTSPtest power
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Approximating a Generalization of Metric TSP
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2007/02/01
Vol. E90-D  No. 2 ; pp. 432-439
Type of Manuscript:  Special Section PAPER (Special Section on Foundations of Computer Science)
Category: Graph Algorithms
approximation algorithmedge-connectivitydegree specificationgraph algorithmmetricnetwork designTSP
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A New Neural Network Algorithm with the Orthogonal Optimized Parameters to Solve the Optimal Problems
Dao Heng YU Jiyou JIA Shinsaku MORI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/09/25
Vol. E76-A  No. 9 ; pp. 1520-1526
Type of Manuscript:  PAPER
Category: Neural Networks
hopfield neural network modelTSPMCPparameter spaceattracting regionorthogonal array
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