Keyword : common source


RF MOSFET Characterization by Four-Port Measurement
Shih-Dao WU Guo-Wei HUANG Kun-Ming CHEN Hua-Chou TSENG Tsun-Lai HSU Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 851-856
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
4-portRF MOSFETcommon sourcecommon gatecommon drainsubstrate bias
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