Kun-Ming CHEN

Noise Parameters Computation of Microwave Devices Using Genetic Algorithms
Han-Yu CHEN Guo-Wei HUANG Kun-Ming CHEN Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/07/01
Vol. E88-C  No. 7  pp. 1382-1384
Type of Manuscript:  Special Section LETTER (Special Section on Recent Technologies of Microwave and Millimeter-Wave Devices Focusing on Miniaturization and Advancement in Performance with Their Applications)
Category: Active Circuits & Antenna
Keyword: 
noisy two-port, noise parameters, genetic algorithm, 
 Summary | Full Text:PDF
A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit
Han-Yu CHEN Kun-Ming CHEN Guo-Wei HUANG Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6  pp. 1133-1141
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: Model
Keyword: 
HBT's, small signal modeling, T-topology, hybrid-π equivalent circuit, 
 Summary | Full Text:PDF
A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement
Ming-Hsiang CHO Guo-Wei HUANG Chia-Sung CHIU Kun-Ming CHEN An-Sam PENG Yu-Min TENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 845-850
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
automatic measurement, cascade configuration, on-wafer de-embedding, silicon, S-parameters, 
 Summary | Full Text:PDF
RF MOSFET Characterization by Four-Port Measurement
Shih-Dao WU Guo-Wei HUANG Kun-Ming CHEN Hua-Chou TSENG Tsun-Lai HSU Chun-Yen CHANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5  pp. 851-856
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
4-port, RF MOSFET, common source, common gate, common drain, substrate bias, 
 Summary | Full Text:PDF
A New Method to Extract MOSFET Threshold Voltage, Effective Channel Length, and Channel Mobility Using S-parameter Measurement
Han-Yu CHEN Kun-Ming CHEN Guo-Wei HUANG Chun-Yen CHANG Tiao-Yuan HUANG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 726-732
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
threshold voltage, effective channel length, channel mobility, S-parameter, automatic measurement, 
 Summary | Full Text:PDF
High-Frequency Characteristics of SiGe Heterojunction Bipolar Transistors under Pulsed-Mode Operation
Kun-Ming CHEN Guo-Wei HUANG Li-Hsin CHANG Hua-Chou TSENG Tsun-Lai HSU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 720-725
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
high-frequency, SiGe, heterojunction bipolar transistor, pulsed measurement, self-heating effect, 
 Summary | Full Text:PDF
An Accurate and Low-Cost Method for On-Wafer LNA Noise Figure Measurement
Sheng-Yu WEN Guo-Wei HUANG Kun-Ming CHEN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2004/05/01
Vol. E87-C  No. 5  pp. 742-748
Type of Manuscript:  Special Section PAPER (Special Section on Advances in Characterization and Measurement Technologies for Microwave and Millimeter-Wave Materials, Devices and Circuits)
Category: Active Devices and Circuits
Keyword: 
on-wafer, noise figure measurement, low-noise amplifier, 
 Summary | Full Text:PDF