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| Keyword : soft error
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Double Modular Redundancy Design of LSI Controller for Soft Error Tolerance
Katsutoshi OTSUKA Kazuhito ITO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2025/03/01
Vol. E108-A
No. 3 ;
pp. 491-499
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
DMR, controller, soft error, LSI design, | | | Summary | Full Text:PDF | |
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Register Minimization and its Application in Schedule Exploration for Area Minimization for Double Modular Redundancy LSI Design
Yuya KITAZAWA Kazuhito ITO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2022/03/01
Vol. E105-A
No. 3 ;
pp. 530-539
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
double modular redundancy, register minimization, soft error, LSI design, | | | Summary | Full Text:PDF | |
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Minimization of Vote Operations for Soft Error Detection in DMR Design with Error Correction by Operation Re-Execution
Kazuhito ITO Yuto ISHIHARA Shinichi NISHIZAWA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2018/12/01
Vol. E101-A
No. 12 ;
pp. 2271-2279
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
soft error, error detection, DMR, checkpoint, scheduling, | | | Summary | Full Text:PDF | |
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A Low Power Soft Error Hardened Latch with Schmitt-Trigger-Based C-Element
Saki TAJIMA Nozomu TOGAWA Masao YANAGISAWA Youhua SHI | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2018/07/01
Vol. E101-A
No. 7 ;
pp. 1025-1034
Type of Manuscript:
Special Section PAPER (Special Section on Design Methodologies for System on a Chip)
Category:
Keyword:
soft error, low-power, latch, C-element, | | | Summary | Full Text:PDF | |
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A Low-Power Radiation-Hardened Flip-Flop with Stacked Transistors in a 65 nm FDSOI Process
Haruki MARUOKA Masashi HIFUMI Jun FURUTA Kazutoshi KOBAYASHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2018/04/01
Vol. E101-C
No. 4 ;
pp. 273-280
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category:
Keyword:
single event effect, soft error, α particle, neutron, heavy ion, FDSOI, flip-flop, low-power consumption, | | | Summary | Full Text:PDF | |
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Reliability Evaluation Environment for Exploring Design Space of Coarse-Grained Reconfigurable Architectures
Takashi IMAGAWA Masayuki HIROMOTO Hiroyuki OCHI Takashi SATO | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2010/12/01
Vol. E93-A
No. 12 ;
pp. 2524-2532
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: High-Level Synthesis and System-Level Design
Keyword:
soft error, TMR, reliability, methodology, | | | Summary | Full Text:PDF | |
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Reliability Inherent in Heterogeneous Multiprocessor Systems and Task Scheduling for Ameliorating Their Reliability
Makoto SUGIHARA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A
No. 4 ;
pp. 1121-1128
Type of Manuscript:
Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
Category:
Keyword:
soft error, single event upset, reliability, task scheduling, heterogeneous multiprocessor systems, | | | Summary | Full Text:PDF | |
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Minority Carrier Collection in 256 M-bit DRAM Cell on Incidence of Alpha-Particle Analyzed by Three-Dimensional Device Simulation
Sumiko OSHIDA Masao TAGUCHI | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C
No. 11 ;
pp. 1604-1610
Type of Manuscript:
Special Section PAPER (Special Issue on LSI Memories)
Category: DRAM
Keyword:
soft error, device simulation, 256 M-bit DRAM, | | | Summary | Full Text:PDF | |
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