Keiji MABUCHI


New α-Particle Induced Soft Error Mechanism in a Three Dimensional Capacitor Cell
Yukihito OOWAKI Keiji MABUCHI Shigeyoshi WATANABE Kazunori OHUCHI Jun'ichi MATSUNAGA Fujio MASUOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1995/07/25
Vol. E78-C  No. 7  pp. 845-851
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Memory Device, Circuit, Architecture and Application Technologies for Multimedia Age)
Category: 
Keyword: 
α-particlesoft errorDRAM
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