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IEICE Trans

Keyword : run-length coding

Test Compression for Robust Testable Path Delay Fault Testing Using Interleaving and Statistical Coding
Kazuteru NAMBA Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2009/02/01
Vol. E92-D  No. 2 ; pp. 269-282
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test compression, statistical coding, run-length coding, delay fault testing, two-pattern testing, scan testing, 
 Summary | Full Text:PDF
Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time
Yu HU Yinhe HAN Xiaowei LI Huawei LI Xiaoqing WEN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/10/01
Vol. E89-D  No. 10 ; pp. 2616-2625
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
compression, run-length coding, random access scan, power dissipation, test application time, 
 Summary | Full Text:PDF
A Selective Scan Chain Reconfiguration through Run-Length Coding for Test Data Compression and Scan Power Reduction
Youhua SHI Shinji KIMURA Masao YANAGISAWA Tatsuo OHTSUKI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/12/01
Vol. E87-A  No. 12 ; pp. 3208-3215
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword: 
test data compression, scan chain reconfiguration, run-length coding, scan-in power consumption, 
 Summary | Full Text:PDF