Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/04/01 Vol. E91-DNo. 4 ;
pp. 1197-1200 Type of Manuscript: LETTER Category: Dependable Computing Keyword: low power test, scan-based test, X-filling, test application time,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/10/25 Vol. E76-ANo. 10 ;
pp. 1676-1683 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: test generation, scan design, test application time, boolean function manipulation,