IEICE Trans

Keyword : test application time

A Novel Test Data Compression Scheme for SoCs Based on Block Merging and Compatibility Tiebin WU Hengzhu LIU Botao ZHANG
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2014/07/01 Vol. E97-A No. 7 ; pp. 1452-1460 Type of Manuscript: Special Section PAPER (Special Section on Design Methodologies for System on a Chip) Category: Keyword: test data compression, block merging, compatibility, test application time, code-based testing, system-on-chip (SoC),
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Scan Shift Time Reduction Using Test Compaction for On-Chip Delay Measurement Wenpo ZHANG Kazuteru NAMBA Hideo ITO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2014/03/01 Vol. E97-D No. 3 ; pp. 533-540 Type of Manuscript: PAPER Category: Dependable Computing Keyword: small-delay defects, test compaction, test application time, test data volume, on-chip delay measurement,
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MTR-Fill: A Simulated Annealing-Based X-Filling Technique to Reduce Test Power Dissipation for Scan-Based Designs Dong-Sup SONG Jin-Ho AHN Tae-Jin KIM Sungho KANG
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/04/01 Vol. E91-D No. 4 ; pp. 1197-1200 Type of Manuscript: LETTER Category: Dependable Computing Keyword: low power test, scan-based test, X-filling, test application time,
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A Self-Test of Dynamically Reconfigurable Processors with Test Frames Tomoo INOUE Takashi FUJII Hideyuki ICHIHARA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-D No. 3 ; pp. 756-762 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: High-Level Testing Keyword: dynamically reconfigurable processors, self-test, optimal contexts, test application time, test frames,
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A Variable-Length Coding Adjustable for Compressed Test Application Hideyuki ICHIHARA Toshihiro OHARA Michihiro SHINTANI Tomoo INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2007/08/01 Vol. E90-D No. 8 ; pp. 1235-1242 Type of Manuscript: PAPER Category: Dependable Computing Keyword: test compression, variable-length coding, test application time, ATE, Huffman code, and test environment,
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Compression/Scan Co-design for Reducing Test Data Volume, Scan-in Power Dissipation, and Test Application Time Yu HU Yinhe HAN Xiaowei LI Huawei LI Xiaoqing WEN
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/10/01 Vol. E89-D No. 10 ; pp. 2616-2625 Type of Manuscript: PAPER Category: Dependable Computing Keyword: compression, run-length coding, random access scan, power dissipation, test application time,
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Huffman-Based Test Response Coding Hideyuki ICHIHARA Michihiro SHINTANI Tomoo INOUE
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2005/01/01 Vol. E88-D No. 1 ; pp. 158-161 Type of Manuscript: LETTER Category: Dependable Computing Keyword: Huffman code, test compression, test response, test application time, ATE,
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Novel DFT Strategies Using Full/Partial Scan Designs and Test Point Insertion to Reduce Test Application Time Toshinori HOSOKAWA Masayoshi YOSHIMURA Mitsuyasu OHTA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2001/11/01 Vol. E84-A No. 11 ; pp. 2722-2730 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Test Keyword: DFT strategies, full scan design methods, partial scan design methods, test point insertions, test application time,
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Compact Test Sequences for Scan-Based Sequential Circuits Hiroyuki HIGUCHI Kiyoharu HAMAGUCHI Shuzo YAJIMA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1993/10/25 Vol. E76-A No. 10 ; pp. 1676-1683 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Keyword: test generation, scan design, test application time, boolean function manipulation,
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