Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2006/11/01 Vol. E89-DNo. 11pp. 2748-2755 Type of Manuscript: PAPER Category: Dependable Computing Keyword: test generation, don't care value, sequential circuit, stuck-at fault,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3pp. 544-550 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: test compression, don't care identification, Huffman's algorithm, test generation,