Kenjiro TANIGUCHI


Don't Care Identification and Statistical Encoding for Test Data Compression
Seiji KAJIHARA Kenjiro TANIGUCHI Kohei MIYASE Irith POMERANZ Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 544-550
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
test compressiondon't care identificationHuffman's algorithmtest generation
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