Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D
No. 3 ;
pp. 544-550
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword:
test compression, don't care identification, Huffman's algorithm, test generation, |
