Irith POMERANZ


On Finding Don't Cares in Test Sequences for Sequential Circuits
Yoshinobu HIGAMI Seiji KAJIHARA Irith POMERANZ Shin-ya KOBAYASHI Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/11/01
Vol. E89-D  No. 11  pp. 2748-2755
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
test generationdon't care valuesequential circuitstuck-at fault
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Don't Care Identification and Statistical Encoding for Test Data Compression
Seiji KAJIHARA Kenjiro TANIGUCHI Kohei MIYASE Irith POMERANZ Sudhakar M. REDDY 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3  pp. 544-550
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Test Generation and Compaction
Keyword: 
test compressiondon't care identificationHuffman's algorithmtest generation
 Summary | Full Text:PDF