Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2013/09/01 Vol. E96-DNo. 9 ;
pp. 1994-2002 Type of Manuscript: Special Section PAPER (Special Section on Dependable Computing) Category: Keyword: X-bit, don't care identification, X-bit distribution, test compaction,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 544-550 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Test Generation and Compaction Keyword: test compression, don't care identification, Huffman's algorithm, test generation,
