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Vol.E77-B No.3
pp.386-395
Special SectionPAPER
Bandwidth Allocation for Connectionless Service in Private Networks Based on ATM Technology
Tetsuya YOKOTANI, Toshihiro SHIKAMA, |
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Vol.E77-B No.3
pp.396-403
Special SectionPAPER
Frequency and Time Division Multiple Access with Demand-Assignment Using Multicarrier Modulation for Indoor Wireless Communications Systems
Yoshiyuki KINUGAWA, Kazuya SATO, Minoru OKADA, Shinsuke HARA, Norihiko MORINAGA, |
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Summary | Full Text:PDF | |
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Vol.E77-B No.3
pp.404-410
Special SectionPAPER
Flexible Information Sharing and Handling System--Towards Knowledge Propagation--
Yoshiaki SEKI, Toshihiko YAMAKAMI, Akihiro SHIMIZU, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.341-341
FOREWORD
FOREWORD
Eisuke ARAI, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.342-349
INVITED PAPER
Thinned Silicon Layers on Oxide Film, Quartz and Sapphire by Wafer Bonding
Takao ABE, Yasuyuki NAKAZATO, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.350-354
Special SectionPAPER
Device Technology
LATID (Large-Angle-Tilt Implanted Drain) FETs with Buried n- Profile for Deep-Submicron ULSIs
Junji HIRASE, Takashi HORI, Yoshinori ODAKE, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.355-361
Special SectionPAPER
Device Technology
A 0.25-µm BiCMOS Technology Using SOR X-Ray Lithography
Shinsuke KONAKA, Hakaru KYURAGI, Toshio KOBAYASHI, Kimiyoshi DEGUCHI, Eiichi YAMAMOTO, Shigehisa OHKI, Yousuke YAMAMOTO, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.362-366
Special SectionPAPER
Device Technology
Subquarter-Micrometer PMOSFET's with 50-nm Source and Drain Formed by Rapid Vapor-Phase Doping (RVD)
Yukihiro KIYOTA, Tohru NAKAMURA, Taroh INADA, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.367-372
Special SectionPAPER
Device Technology
Hot Carrier Evaluation of TFT by Emission Microscopy
Junko KOMORI, Jun-ichi MITSUHASHI, Shigenobu MAEDA, |
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Summary | Full Text:PDF | |
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Vol.E77-C No.3
pp.373-378
Special SectionPAPER
Device Technology
Degradation Mechanisms of Thin Film SIMOX SOI-MOSFET Characteristics--Optical and Electrical Evaluation--
Mitsuru YAMAJI, Kenji TANIGUSHI, Chihiro HAMAGUCHI, Kazuo SUKEGAWA, Seiichiro KAWAMURA, |
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Summary | Full Text:PDF | |
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