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IEICE Trans

Keyword : sequential logic

Universal Testing for Linear Feed-Forward/Feedback Shift Registers
Hideo FUJIWARA Katsuya FUJIWARA Toshinori HOSOKAWA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2020/05/01
Vol. E103-D  No. 5 ; pp. 1023-1030
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
linear feed-forward shift registers, linear feedback shift registers, test generation, sequential logic, universal test, built-in self-test, secure scan design, 
 Summary | Full Text:PDF