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| Keyword : test pattern
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A Test Pattern Compaction Method Using SAT-Based Fault Grouping
Yusuke MATSUNAGA | Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/12/01
Vol. E99-A
No. 12 ;
pp. 2302-2309
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
ATPG, SAT, test pattern, | | | Summary | Full Text:PDF | |
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